Step into a career with ASM, where cutting edge technology meets collaborative culture.
For over 55 years ASM has been ahead of what’s next, at the forefront of innovation and what’s technologically possible. With more than 4,500 ASMers representing 70 nationalities, our people and our advanced semiconductor devices are playing a crucial role in trends such as 5G, cloud computing, AI, and autonomous driving. But we’re more than just a tech company. We value diversity, inclusion and sustainability as we strive to make a positive impact on the world. Our development programs help support your growth, shaping your future and pushing the boundaries of innovation to unleash potential.
As a Senior Engineer I, Metrology at ASM, you will play a critical role in supporting advanced semiconductor materials and process development. Working within ASM’s R&D lab environment in Korea, you will operate and optimize high-end metrology tools such as TEM and FIB to generate high-quality characterization data.
In this role, you will collaborate closely with process development engineers to enable data-driven decisions, develop advanced metrology applications and recipes, and contribute to the advancement of next-generation ALD and Epitaxy technologies. You will also ensure reliable tool operation and efficient lab performance while supporting continuous improvement in metrology capabilities.
Operate and optimize advanced metrology tools (TEM, FIB) for materials and process characterization
Perform high-quality sample analysis and support internal/external demonstrations and applications development
Develop and optimize metrology recipes, including Best Known Methods (BKM) and production-ready applications
Collaborate closely with process engineers to select appropriate characterization techniques and support data interpretation
Analyze and present metrology results to support process development and engineering decision-making
Troubleshoot tool performance issues and coordinate with vendors to resolve hardware/software challenges
Support metrology tool uptime, monitor SPC data, and participate in tool efficiency improvement initiatives
Develop applications to identify process issues, solve problems, and optimize measurement capability
Maintain laboratory LEAN 6S standards and ensure safe, clean, and efficient lab operations
Support development of new analytical methods and metrology techniques aligned with ASM’s technology roadmap
Train engineers on metrology tools and develop SOPs and recovery procedures for tool-down scenarios
Stay up to date with industry trends, metrology innovations, and new characterization techniques
Master’s or Ph.D. degree in Materials Science, Physics, Chemistry, or a related engineering discipline
Minimum 3 years of hands-on experience operating TEM and/or FIB tools for semiconductor materials or devices
Solid understanding of semiconductor processing and device fabrication
Hands-on experience with metrology techniques such as XRR, XRD, XRF, TXRF, FTIR, SPV, four-point probe, Hall effect, and defect inspection tools is a plus
Strong data analysis and problem-solving skills with the ability to interpret complex results
Experience with SPC data monitoring and equipment performance analytics preferred
Proficiency in MS Office tools; experience with data analysis tools (e.g., JMP) is a plus
Strong communication skills in both Korean and English, with the ability to collaborate effectively across teams
Ability to work independently while managing multiple tasks in a dynamic R&D environment
Apply today to be part of what’s next.
We make the tech that enables the chips in devices which improve lives around the world. We do this with an eye to the future, pushing the boundaries of what’s possible through cutting-edge innovation, and driving the next wave of technological breakthroughs that shape how we live, work, and connect.
To learn more about ASM, find us at asm.com and on LinkedIn, Facebook, Instagram, X and YouTube.
ASM is an equal opportunity employer and considers qualified applicants for employment without regard to race, color, religion, age, nationality, social or ethnic origin, sexual orientation, gender, gender identify or expression, marital status, pregnancy, political affiliation, disability, genetic information, veteran status, or any other characteristic protected by law.
